X射線譜致力于快速發(fā)表論文處理x射線光譜法的理論和應(yīng)用使用電子,X射線光子,質(zhì)子,γ和γ-X來源。涵蓋了先進(jìn)的技術(shù)，方法和設(shè)備，這個建立的期刊為討論更復(fù)雜的x射線分析方法提供了理想的平臺。包括波長和能量色散系統(tǒng)，以及一系列數(shù)據(jù)處理方法，從最簡單的到非常復(fù)雜的軟件程序。有關(guān)X射線光譜分析方法在結(jié)構(gòu)分析方面的應(yīng)用的論文，以及涉及環(huán)境分析和監(jiān)測、藝術(shù)和古物學(xué)研究、礦物學(xué)、法醫(yī)學(xué)、地質(zhì)學(xué)、表面科學(xué)和材料分析、生物醫(yī)學(xué)和藥物應(yīng)用等廣泛領(lǐng)域的應(yīng)用論文，也都是專題報道。

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.